The corpus · Interconnects & Materials
Metallization with tailorable coefficient of thermal expansion
US8141556B2 · filed 2007-04-27 · granted 2012-03-27 · Medtronic, Inc. major
Abstract T1 · from the patent
An interconnect for an implantable medical device includes a pad and a first layer introduced over the pad. At least one of the pad or the first layer comprises a negative coefficient of thermal expansion (CTE) material.
Why it ranks where it does
Sole-inventor negative-CTE metallization (Nb/Nb2O5 with an explicit design equation); 4 of 5 visible citations are Lockheed Martin.
Signals: sole inventor · see methodology.
Inventors
David A. Ruben
Read the full patent on Google Patents → (claims, figures, citations — all public domain)