The corpus · Interconnects & Materials

Metallization with tailorable coefficient of thermal expansion

US8141556B2 · filed 2007-04-27 · granted 2012-03-27 · Medtronic, Inc. major

Abstract T1 · from the patent

An interconnect for an implantable medical device includes a pad and a first layer introduced over the pad. At least one of the pad or the first layer comprises a negative coefficient of thermal expansion (CTE) material.

Why it ranks where it does

Sole-inventor negative-CTE metallization (Nb/Nb2O5 with an explicit design equation); 4 of 5 visible citations are Lockheed Martin.

Signals: sole inventor · see methodology.

Inventors

David A. Ruben

Read the full patent on Google Patents → (claims, figures, citations — all public domain)